Title of article :
On-site analysis of heavy metal contaminated areas by means of total reflection X-ray fluorescence analysis (TXRF)
Author/Authors :
Stosnach، نويسنده , , Hagen، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2006
Pages :
5
From page :
1141
To page :
1145
Abstract :
In this paper the possibilities and restriction for applying the low power TXRF spectrometer PicoTAX for the one-site analysis of heavy metal contaminated soils and sediments are evaluated. Basis for this evaluation is the Superfund Innovative Technology Evaluation (SITE) program, conducted by the U.S. Environmental Protection Protection Agency (US EPA). During a measurement campaign, performed under realistic conditions, 320 soil and sediment samples were analyzed. The task was the fast analysis of the main target elements antimony, arsenic, cadmium, chromium, copper, iron, lead, mercury, nickel, selenium, silver, vanadium, and zinc. These elements were present in wide ranging concentrations. a set of seven primary and five secondary objectives the method detection limits, accuracy and precision of the TXRF measurements are discussed. ition to the on-site measurements, the application of TXRF analysis for the analysis of soil- and sediment samples after complete microwave assisted acid digestion is reported. instrument improvements have distinctly increased the quality of measurement results. A detailed description of these new developments and new measurement results are discussed
Keywords :
TXRF , Environmental , On-site analysis
Journal title :
Spectrochimica Acta Part B Atomic Spectroscopy
Serial Year :
2006
Journal title :
Spectrochimica Acta Part B Atomic Spectroscopy
Record number :
1680743
Link To Document :
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