• Title of article

    Understanding crystal growth in vacuum and beyond

  • Author/Authors

    Vlieg، نويسنده , , Elias، نويسنده ,

  • Issue Information
    هفته نامه با شماره پیاپی سال 2002
  • Pages
    17
  • From page
    458
  • To page
    474
  • Abstract
    For a detailed understanding of crystal growth, the atomic-scale structure of the growing interface must be known. While such knowledge is available in vacuum environments, this is not the case if the crystal grows from a solution, melt or solid. X-ray diffraction is one of the few techniques that can be applied for this purpose and it is starting to provide information on the structure of both sides of a growing interface. This means that structural details like relaxation and reconstruction on the crystal surface and ordering in the solution can be included in the theoretical description of crystal growth.
  • Keywords
    morphology , and topography , Roughness , Solid–liquid interfaces , X-Ray scattering , and reflection , growth , Molecular Beam Epitaxy , Diffraction , Surface relaxation and reconstruction , surface structure
  • Journal title
    Surface Science
  • Serial Year
    2002
  • Journal title
    Surface Science
  • Record number

    1681088