Title of article
Understanding crystal growth in vacuum and beyond
Author/Authors
Vlieg، نويسنده , , Elias، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2002
Pages
17
From page
458
To page
474
Abstract
For a detailed understanding of crystal growth, the atomic-scale structure of the growing interface must be known. While such knowledge is available in vacuum environments, this is not the case if the crystal grows from a solution, melt or solid. X-ray diffraction is one of the few techniques that can be applied for this purpose and it is starting to provide information on the structure of both sides of a growing interface. This means that structural details like relaxation and reconstruction on the crystal surface and ordering in the solution can be included in the theoretical description of crystal growth.
Keywords
morphology , and topography , Roughness , Solid–liquid interfaces , X-Ray scattering , and reflection , growth , Molecular Beam Epitaxy , Diffraction , Surface relaxation and reconstruction , surface structure
Journal title
Surface Science
Serial Year
2002
Journal title
Surface Science
Record number
1681088
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