Title of article :
Fractalization of silicon islands at a coverage close to 0.5 monolayers
Author/Authors :
Olami، نويسنده , , Zeev and Manassen، نويسنده , , Yishay and Ramesh Rao، نويسنده , , N and Dana، نويسنده , , Rami، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2002
Pages :
8
From page :
35
To page :
42
Abstract :
Fractal islands are normally observed when the growth is a result of many random coalescence events of small islands or atoms with the growing cluster. In this paper, we show that fractalization can be observed also for growing islands at a coverage which is close to 0.5 monolayers. This was shown for a Si(1 1 1) surface covered by 0.53 monolayer of silicon. This fractalization is explained by the simple conservative Ising model, where the diffusion of a single atom is simulated by a single spin flip. In this model, fractal islands are observed over a finite scaling range where smaller islands have a dimension of 2 and larger ones are fractal. The fractal dimension and the scaling range are dependent on the fraction (equivalent to coverage) p of spin up (or down). Both the dimension and range increase as p approaches 0.5. We show that the growth of the clusters is in agreement with a classical t0.33 law [Phys. Rev. B 34 (1986) 7845].
Keywords :
GROWTH , Monte Carlo simulations , Dendritic and/or fractal surfaces , Silicon , Scanning tunneling microscopy
Journal title :
Surface Science
Serial Year :
2002
Journal title :
Surface Science
Record number :
1681739
Link To Document :
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