Title of article
XPS and SSIMS studies of Pd/SnOx system: reduction and oxidation in hydrogen containing air
Author/Authors
M. Moroseac، نويسنده , , M. and Sk?la، نويسنده , , T. and Veltrusk?، نويسنده , , K. and Matol??n، نويسنده , , V. and Matol??nov?، نويسنده , , I.، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2004
Pages
6
From page
1118
To page
1123
Abstract
In this work the study of a redox process on Pd/SnOx system by means of X-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectrometry (SSIMS) is presented. SnOx substrates were prepared by spray pyrolysis onto Si(1 1 1). Palladium ultra-thin films were evaporated in UHV chamber and then stabilised in air at 720 K for 2 h. Results obtained after thermal treatment in 1% H2 containing air and in pure air showed the reversible change in palladium chemical state.
Keywords
PALLADIUM , X-ray photoelectron spectroscopy , Metal–semiconductor interfaces , Tin oxides , Secondary ion mass spectroscopy
Journal title
Surface Science
Serial Year
2004
Journal title
Surface Science
Record number
1682300
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