Title of article :
XPS and SSIMS studies of Pd/SnOx system: reduction and oxidation in hydrogen containing air
Author/Authors :
M. Moroseac، نويسنده , , M. and Sk?la، نويسنده , , T. and Veltrusk?، نويسنده , , K. and Matol??n، نويسنده , , V. and Matol??nov?، نويسنده , , I.، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2004
Abstract :
In this work the study of a redox process on Pd/SnOx system by means of X-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectrometry (SSIMS) is presented. SnOx substrates were prepared by spray pyrolysis onto Si(1 1 1). Palladium ultra-thin films were evaporated in UHV chamber and then stabilised in air at 720 K for 2 h. Results obtained after thermal treatment in 1% H2 containing air and in pure air showed the reversible change in palladium chemical state.
Keywords :
PALLADIUM , X-ray photoelectron spectroscopy , Metal–semiconductor interfaces , Tin oxides , Secondary ion mass spectroscopy
Journal title :
Surface Science
Journal title :
Surface Science