Title of article :
Measurement of electron transport properties of molecular junctions fabricated by electrochemical and mechanical methods
Author/Authors :
Li، نويسنده , , X.L. and He، نويسنده , , H.X. and Xu، نويسنده , , B.Q. and Xiao، نويسنده , , X.Y. and Nagahara، نويسنده , , L.A. and Amlani، نويسنده , , I. and Tsui، نويسنده , , Dwight R. and Tao، نويسنده , , N.J.، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2004
Pages :
10
From page :
1
To page :
10
Abstract :
We describe two methods to fabricate metal-molecule-metal junctions. The first method starts with a pair of electrodes separated with a molecular scale gap on an oxidized silicon substrate. These electrodes are fabricated by combining electron beam lithography and electrochemical deposition/etching. A molecular junction is formed when a molecule bridges the gap. This method can fabricate rather stable molecular junctions, however, the yield is low and the exact number of molecules in the junctions is uncertain. The second method forms a molecular junction by separating a scanning tunneling microscope tip from contact with a metal substrate in a solution containing sample molecules. This method, although is not device compatible, can create a large number of molecular junctions over a short period of time, which is ideal for statistical analysis.
Keywords :
Electrical transport measurements , Electrochemical methods
Journal title :
Surface Science
Serial Year :
2004
Journal title :
Surface Science
Record number :
1682429
Link To Document :
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