Title of article
Bimodal growth of manganese silicide on Si(1 0 0)
Author/Authors
Lippitz، نويسنده , , H. and Paggel، نويسنده , , J.J. and Fumagalli، نويسنده , , P.، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2005
Pages
6
From page
307
To page
312
Abstract
Two different growth modes of manganese silicide are observed on Si(1 0 0) with scanning tunneling microscopy. 1.0 and 1.5 monolayer Mn are deposited at room temperature on the Si(1 0 0)-(2 × 1) substrate. The as-grown Mn film is unstructured. Annealing temperatures between room temperature and 450 °C lead to small unstructured clusters of Mn or MnxSiy. Upon annealing at 450 °C and 480 °C, Mn reacts chemically with the Si substrate and forms silicide islands. The dimer rows of the substrate become visible again. Two distinct island shapes are found and identified as MnSi and Mn5Si3.
Keywords
surface structure , morphology , Manganese , Roughness , Scanning tunneling microscopy , and topography , Silicon
Journal title
Surface Science
Serial Year
2005
Journal title
Surface Science
Record number
1682613
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