Title of article :
Bimodal growth of manganese silicide on Si(1 0 0)
Author/Authors :
Lippitz، نويسنده , , H. and Paggel، نويسنده , , J.J. and Fumagalli، نويسنده , , P.، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2005
Abstract :
Two different growth modes of manganese silicide are observed on Si(1 0 0) with scanning tunneling microscopy. 1.0 and 1.5 monolayer Mn are deposited at room temperature on the Si(1 0 0)-(2 × 1) substrate. The as-grown Mn film is unstructured. Annealing temperatures between room temperature and 450 °C lead to small unstructured clusters of Mn or MnxSiy. Upon annealing at 450 °C and 480 °C, Mn reacts chemically with the Si substrate and forms silicide islands. The dimer rows of the substrate become visible again. Two distinct island shapes are found and identified as MnSi and Mn5Si3.
Keywords :
surface structure , morphology , Manganese , Roughness , Scanning tunneling microscopy , and topography , Silicon
Journal title :
Surface Science
Journal title :
Surface Science