Author/Authors :
Koitzsch، نويسنده , , C. and Bovet، نويسنده , , M. and Clerc، نويسنده , , F. and Naumovi?، نويسنده , , D. and Schlapbach، نويسنده , , L. and Aebi، نويسنده , , P.، نويسنده ,
Abstract :
We report on the growth of single crystalline epitaxial Bi films on W(1 1 0). X-ray photoelectron diffraction (XPD) and low energy electron diffraction (LEED) reveal that Bi grows well ordered in the pseudocubic (0 0 1) orientation. The two-fold symmetric W(1 1 0) surface supports four different Bi(0 0 1) domains. The multi-domain nature is unambigously detected via LEED showing a peculiar splitting of spots. It is shown that a preferential domain alignment along the [0 0 1]tungsten-direction accounts for this observation and is in agreement with a two-fold XPD pattern.
Keywords :
Low energy electron diffraction (LEED) , Photoelectron diffraction measurement , GROWTH , Tungsten , Bismuth
