Title of article :
Fundamental parameter based quantification algorithm for confocal nano-X-ray fluorescence analysis
Author/Authors :
Schoonjans، نويسنده , , Tom and Silversmit، نويسنده , , Geert and Vekemans، نويسنده , , Bart and Schmitz، نويسنده , , Sylvia and Burghammer، نويسنده , , Manfred and Riekel، نويسنده , , Christian and Brenker، نويسنده , , Frank E. and Vincze، نويسنده , , Laszlo، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2012
Pages :
11
From page :
32
To page :
42
Abstract :
A new method for the quantification of X-ray fluorescence (XRF) was derived based on the fundamental parameter method (FPM). The FPM equations were adapted to accommodate the special case of confocal nano-XRF, i.e. X-ray nano-beam excitation coupled with confocal detection, taking into account the special characteristics of the detector channel polycapillary. A thorough error estimation algorithm based on the Monte Carlo method was applied, producing a detailed analysis of the uncertainties of the quantification results. The new FPM algorithm was applied on confocal nano-XRF data obtained from cometary dust returned by NASAʹs Stardust mission, recorded at beamline ID13 of the European Synchrotron Radiation Facility.
Keywords :
Quantification , confocal , Fundamental parameter method , X-ray fluorescence
Journal title :
Spectrochimica Acta Part B Atomic Spectroscopy
Serial Year :
2012
Journal title :
Spectrochimica Acta Part B Atomic Spectroscopy
Record number :
1683930
Link To Document :
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