Title of article
Influence of Ge content on formation of radiation defects in Si1−xGex solid solutions
Author/Authors
Atabaev، نويسنده , , I.G. and Matchanov، نويسنده , , N.A. and Yusupov، نويسنده , , A. and Saidov، نويسنده , , D.Sh. and Saidov، نويسنده , , M.S.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2008
Pages
3
From page
832
To page
834
Abstract
The process of radiation defect formation in bulk Si1−xGex alloy was investigated taking into account the dependence of introduction rates of primary radiation defects on the content of Ge and intensity of irradiation. A new expression was obtained which describes the dependence of divacancy concentration in Si1−xGex alloy at various introduction rates of primary radiation defects under electron, thermal and fast neutron irradiation.
Keywords
Hardness , Defects , infrared spectroscopy , Alloys , Semiconductors
Journal title
Computational Materials Science
Serial Year
2008
Journal title
Computational Materials Science
Record number
1684184
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