• Title of article

    Monte Carlo modeling of Si(1 0 0) roughening due to adsorbate–adsorbate repulsion

  • Author/Authors

    Aldao، نويسنده , , C.M. and Guidoni، نويسنده , , S.E. and Xu، نويسنده , , G.J. and Nakayama، نويسنده , , Koji S. and Weaver، نويسنده , , J.H.، نويسنده ,

  • Issue Information
    هفته نامه با شماره پیاپی سال 2004
  • Pages
    7
  • From page
    143
  • To page
    149
  • Abstract
    The pits and Si regrowth islands that form during the roughening of Si(1 0 0) by Cl at 700 K have characteristic patterns that depend on the amount of adsorbed Cl, suggesting the importance of adsorbate–adsorbate steric repulsive interactions. Monte Carlo simulations of roughening focused on those interactions. While the resulting morphology resembles those observed at intermediate coverage, the inability of the simulations to reproduce the experiment results at low coverage indicates that other interactions must be considered, including strain anisotropies that would favor the formation of large features.
  • Keywords
    Surface roughening , surface structure , Roughness , Silicon , Halogens , Monte Carlo simulations , and topography , morphology
  • Journal title
    Surface Science
  • Serial Year
    2004
  • Journal title
    Surface Science
  • Record number

    1684327