Title of article
Monte Carlo modeling of Si(1 0 0) roughening due to adsorbate–adsorbate repulsion
Author/Authors
Aldao، نويسنده , , C.M. and Guidoni، نويسنده , , S.E. and Xu، نويسنده , , G.J. and Nakayama، نويسنده , , Koji S. and Weaver، نويسنده , , J.H.، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2004
Pages
7
From page
143
To page
149
Abstract
The pits and Si regrowth islands that form during the roughening of Si(1 0 0) by Cl at 700 K have characteristic patterns that depend on the amount of adsorbed Cl, suggesting the importance of adsorbate–adsorbate steric repulsive interactions. Monte Carlo simulations of roughening focused on those interactions. While the resulting morphology resembles those observed at intermediate coverage, the inability of the simulations to reproduce the experiment results at low coverage indicates that other interactions must be considered, including strain anisotropies that would favor the formation of large features.
Keywords
Surface roughening , surface structure , Roughness , Silicon , Halogens , Monte Carlo simulations , and topography , morphology
Journal title
Surface Science
Serial Year
2004
Journal title
Surface Science
Record number
1684327
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