• Title of article

    Structure-dependent mixed valence of Sm on Cu(1 1 1) studied by XPS and STM

  • Author/Authors

    Nakayama، نويسنده , , Yasuo and Kondoh، نويسنده , , Hiroshi and Ohta، نويسنده , , Toshiaki، نويسنده ,

  • Issue Information
    هفته نامه با شماره پیاپی سال 2004
  • Pages
    10
  • From page
    53
  • To page
    62
  • Abstract
    Geometric and electronic structures of adsorbed Sm on Cu(1 1 1) were studied by scanning tunneling microscopy (STM) and X-ray photoelectron spectroscopy (XPS). The surface morphology and Sm valency change with the Sm coverage, suggesting that Sm atoms in the islands have a valence of approximately 2.7 and those diffusing are divalent. Heating the adlayers yields surface alloy and close-packed overlayer of Sm depending on the coverage and temperature. Atomically resolved STM images indicate that the surface of the alloy phase is not rigid. The closed packed overlayer of a mixed valence Sm is observed as a uniform atomic species.
  • Keywords
    morphology , Roughness , and topography , Surface potential , Surface states , etc.) , Lanthanides , Copper , X-ray photoelectron spectroscopy , Scanning tunneling microscopy , Low energy electron diffraction (LEED) , GROWTH , surface structure , Surface electronic phenomena (work function
  • Journal title
    Surface Science
  • Serial Year
    2004
  • Journal title
    Surface Science
  • Record number

    1684350