Title of article :
Structure-dependent mixed valence of Sm on Cu(1 1 1) studied by XPS and STM
Author/Authors :
Nakayama، نويسنده , , Yasuo and Kondoh، نويسنده , , Hiroshi and Ohta، نويسنده , , Toshiaki، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2004
Pages :
10
From page :
53
To page :
62
Abstract :
Geometric and electronic structures of adsorbed Sm on Cu(1 1 1) were studied by scanning tunneling microscopy (STM) and X-ray photoelectron spectroscopy (XPS). The surface morphology and Sm valency change with the Sm coverage, suggesting that Sm atoms in the islands have a valence of approximately 2.7 and those diffusing are divalent. Heating the adlayers yields surface alloy and close-packed overlayer of Sm depending on the coverage and temperature. Atomically resolved STM images indicate that the surface of the alloy phase is not rigid. The closed packed overlayer of a mixed valence Sm is observed as a uniform atomic species.
Keywords :
morphology , Roughness , and topography , Surface potential , Surface states , etc.) , Lanthanides , Copper , X-ray photoelectron spectroscopy , Scanning tunneling microscopy , Low energy electron diffraction (LEED) , GROWTH , surface structure , Surface electronic phenomena (work function
Journal title :
Surface Science
Serial Year :
2004
Journal title :
Surface Science
Record number :
1684350
Link To Document :
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