Author/Authors :
Baudot، نويسنده , , G. and Girard، نويسنده , , Y. and Repain، نويسنده , , V. and Rohart، نويسنده , , S. and Rousset، نويسنده , , S. and Kreckelbergh، نويسنده , , S. and Coati، نويسنده , , A. and Garreau، نويسنده , , Y.، نويسنده ,
Abstract :
We report on a step-induced morphological modification in Cobalt thin films (from 5 to 90 monolayers (ML)) on Au(1 1 1) substrates studied by grazing incidence X-ray diffraction (GIXD). When the cobalt film is deposited on the highly stepped Au(2 3 3) substrate its structure is found to be mainly face centered cubic (FCC) whereas its natural bulk structure is hexagonal close-packed (HCP). Relaxation and stacking fault probability have been determined using a simple diffraction model which fits all the GIXD data. A vicinal Co interface including this stacking fault probability and a small rotation of the Co(1 1 1) planes with respect to the Au(1 1 1) planes is proposed which is in exact registry with the Au vicinal surface.
Keywords :
X-Ray scattering , Diffraction , and reflection , Cobalt , Gold , Growth , Vicinal single crystal surfaces