Title of article
Layer-by-layer growth of lead on Ge(1 1 1) at low temperatures
Author/Authors
Grill، نويسنده , , L and Cvetko، نويسنده , , D and Petaccia، نويسنده , , L and Ratto، نويسنده , , F and Modesti، نويسنده , , S، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2004
Pages
8
From page
7
To page
14
Abstract
The growth of lead on Ge(1 1 1) at 120 K was investigated by various experimental methods. He atom scattering experiments were used to determine the low temperature growth morphology of the Pb/Ge(1 1 1) system. The growth modes at low and room temperature were also compared by Auger electron spectroscopy, low energy electron diffraction, and by the observation of inelastic electron scattering through image potential resonances indicating the presence of Pb islands at 300 K and of a continuous Pb film at 120 K. In contrast to the well-known room temperature Stranski–Krastanov growth mode, strong evidence for a layer-by-layer growth from three monolayers coverage onwards was found for Pb on Ge(1 1 1) at low temperature.
Keywords
Atom–solid scattering and diffraction – elastic , growth , Germanium , Lead , Auger electron spectroscopy , Electron energy loss spectroscopy (EELS)
Journal title
Surface Science
Serial Year
2004
Journal title
Surface Science
Record number
1684760
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