• Title of article

    Surface structure of GaAs(0 0 1)-c(4 × 4) studied by LEED intensity analysis

  • Author/Authors

    Nagashima ، نويسنده , , A. and Nishimura، نويسنده , , A. and Kawakami، نويسنده , , T. P. YOSHINO، نويسنده , , J.، نويسنده ,

  • Issue Information
    هفته نامه با شماره پیاپی سال 2004
  • Pages
    7
  • From page
    218
  • To page
    224
  • Abstract
    From the results of scanning tunneling microscopy and intensity analysis of low-energy electron diffraction, it was confirmed that under the conditions of molecular beam epitaxy using As4, the c(4 × 4) reconstruction on GaAs(0 0 1) has two phases with different surface compositions. While the lesser As coverage phase has a structure that contains three As–Ga dimers per unit cell, the higher As coverage phase has a structure containing three As–As dimers with 2 mm symmetry. Detailed atomic geometries for the two phases were presented.
  • Keywords
    Scanning tunneling microscopy , Gallium arsenide , surface structure , morphology , and topography , Low energy electron diffraction (LEED) , Roughness
  • Journal title
    Surface Science
  • Serial Year
    2004
  • Journal title
    Surface Science
  • Record number

    1684837