Title of article :
Surface structure of GaAs(0 0 1)-c(4 × 4) studied by LEED intensity analysis
Author/Authors :
Nagashima ، نويسنده , , A. and Nishimura، نويسنده , , A. and Kawakami، نويسنده , , T. P. YOSHINO، نويسنده , , J.، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2004
Abstract :
From the results of scanning tunneling microscopy and intensity analysis of low-energy electron diffraction, it was confirmed that under the conditions of molecular beam epitaxy using As4, the c(4 × 4) reconstruction on GaAs(0 0 1) has two phases with different surface compositions. While the lesser As coverage phase has a structure that contains three As–Ga dimers per unit cell, the higher As coverage phase has a structure containing three As–As dimers with 2 mm symmetry. Detailed atomic geometries for the two phases were presented.
Keywords :
Scanning tunneling microscopy , Gallium arsenide , surface structure , morphology , and topography , Low energy electron diffraction (LEED) , Roughness
Journal title :
Surface Science
Journal title :
Surface Science