Title of article
Thickness dependent valence fluctuation of CeN film
Author/Authors
Xiao، نويسنده , , Wende and Guo، نويسنده , , Qinlin and Wang، نويسنده , , E.G.، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2004
Pages
5
From page
296
To page
300
Abstract
CeN films with different thickness are synthesized on a Re(0 0 0 1) substrate and studied by X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy. A thickness dependent valence fluctuation is observed by XPS. Valence fluctuation only occurs with film thickness larger than a critical value of about 15 nm. This interesting phenomenon is mainly attributed to the stress in CeN films due to the large lattice mismatch between the CeN film and the substrate, and a possible composition deviation at the interface.
Keywords
Cerium , X-ray photoelectron spectroscopy , Auger electron spectroscopy , nitrides
Journal title
Surface Science
Serial Year
2004
Journal title
Surface Science
Record number
1684937
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