Title of article :
A high resolution photoemission study of phenol adsorption on Si(1 0 0)2 × 1
Author/Authors :
Casaletto، نويسنده , , M.P. and Carbone، نويسنده , , M. N. Piancastelli، نويسنده , , M.N. and Horn، نويسنده , , K. and Weiss، نويسنده , , K. and Zanoni، نويسنده , , R.، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2005
Pages :
7
From page :
42
To page :
48
Abstract :
The adsorption of a bi-functional organic molecule like phenol on Si(1 0 0)2 × 1 has been investigated by synchrotron radiation-induced photoemission in the valence band, Si 2p, C 1s and O 1s core-level regions. Experiments have been carried out as a function of phenol exposure at room temperature. Phenol adsorbs on Si(1 0 0)2 × 1 through a dissociative mechanism at room temperature, interacting with the surface by its alcoholic functionality. The line-shape analysis of Si 2p spectra indicates the formation of Si–O and Si–H bonds, as a consequence of the cleavage of the C6H5O–H bond and the binding of the fragments (C6H5O– group and H atom) to the Si(1 0 0)2 × 1 surface dimers. The progressive quenching of the silicon surface dimer atoms and the corresponding intensity increase of the Si–OC6H5 and Si–H components have been observed as a function of phenol exposure. The presence of the phenoxide (C6H5O–) group on the silicon surface has been evidenced also by the C 1s spectrum, consisting of two components in a 1:5 intensity ratio, energy splitted by 1.5 eV, which can be assigned to carbon atom linked to oxygen (C–O group) and carbon atoms of the aromatic ring, respectively.
Keywords :
Surface chemical reaction , Silicon , Single crystal surface , Phenol adsorption , Synchrotron radiation photoelectron spectroscopy , High resolution core-level photoemission
Journal title :
Surface Science
Serial Year :
2005
Journal title :
Surface Science
Record number :
1685140
Link To Document :
بازگشت