Title of article :
Structural instability of Si(1 1 1)-(7 × 7) induced by low-energy electron irradiation
Author/Authors :
Sugita، نويسنده , , Y. and Horiike، نويسنده , , H. and Kanasaki، نويسنده , , J. and Tanimura، نويسنده , , K.، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2005
Pages :
5
From page :
168
To page :
172
Abstract :
We study structural changes on the Si(1 1 1)-(7 × 7) surface under low-energy electron irradiation with primary energies ranging from 15 to 30 eV. The irradiation induces bond breaking of adatoms of the reconstructed structure, leading to the formation of vacancies at the surface sites. The rate of vacancy formation is proportional to the electron intensity, and the cross section of vacancy formation decreases with increasing primary energy of incident electrons. Possible role of surface plasmon excitation has been discussed for the mechanism of electron-induced bond-breaking processes.
Keywords :
Electron bombardment , Desorption induced by electron stimulation , Surface roughening , Silicon , Scanning tunneling microscopy
Journal title :
Surface Science
Serial Year :
2005
Journal title :
Surface Science
Record number :
1685368
Link To Document :
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