Title of article
Enhanced surface sensitivity in AES relative to XPS observed in free argon clusters
Author/Authors
Lundwall، نويسنده , , Marcus and Tchaplyguine، نويسنده , , Maxim and ضhrwall، نويسنده , , Gunnar and Lindblad، نويسنده , , Andreas and Peredkov، نويسنده , , Sergey and Rander، نويسنده , , Torbjِrn and Svensson، نويسنده , , Svante and Bjِrneholm، نويسنده , , Olle، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2005
Pages
8
From page
12
To page
19
Abstract
The surface-to-bulk intensity ratio in Auger electron spectra has been studied in comparison with core-level photoelectron spectra using free argon clusters of sizes ranging over two orders of magnitude. Enhanced surface sensitivity is observed in L2,3M2,3M2,3 Auger electron spectra compared to 2p photoelectron spectra where electrons of similar kinetic energies were recorded. This is discussed in terms of the effective attenuation length of the electrons.
Keywords
Surface sensitivity , Effective attenuation length , Auger ejection , Synchrotron radiation photoelectron spectroscopy , Photoelectron spectroscopy , Auger electron spectroscopy , Photoelectron emission
Journal title
Surface Science
Serial Year
2005
Journal title
Surface Science
Record number
1685395
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