• Title of article

    AFM tip induced formation of nanometer scale structures on WSe2 under defined conditions

  • Author/Authors

    Jaeckel، نويسنده , , B. and Gassenbauer، نويسنده , , Y. and Jaegermann، نويسنده , , W. and Tomm، نويسنده , , Y.، نويسنده ,

  • Issue Information
    هفته نامه با شماره پیاپی سال 2005
  • Pages
    15
  • From page
    65
  • To page
    79
  • Abstract
    Under controlled ambient conditions it is possible to produce different types of structures onto WSe2 (0 0 0 1) surface with AFM by applying a voltage pulse between tip and sample. The structure size can be varied over three orders of magnitude from the nanometer-scale up to structures of several μm in diameter. Four different types of structures were observed as surface roughening, hole structures induced by etching, surface oxide layers and volcano-like structures depending on experimental parameters as humidity as well as polarity, height and duration of the voltage pulses. Models of cluster formation mechanism will be given based on systematic studies of the experimental dependencies.
  • Keywords
    STM , AFM , Electrochemical nanotechnology , Force–distance-curves , Layered semiconductors
  • Journal title
    Surface Science
  • Serial Year
    2005
  • Journal title
    Surface Science
  • Record number

    1685483