Title of article
H adsorption at Ag/Si interfaces in epitaxially grown Ag(1 1 1) films on Si(1 1 1)7 × 7 substrates
Author/Authors
Aoki، نويسنده , , Yuki and Shi، نويسنده , , Lin and Sugimoto، نويسنده , , Tadashi and Hirayama، نويسنده , , Hiroyuki، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2010
Pages
4
From page
420
To page
423
Abstract
The interaction of atomic H with Ag(1 1 1)/Si(1 1 1)7 × 7 surfaces was studied by thermal desorption (TD) spectroscopy and scanning tunneling microscopy (STM) at room temperature. TD spectroscopy revealed an intense peak from mono H–Si bonds, even though the Si surface was covered by the Ag atoms. This peak was not observed from Ag-coated SiO2/Si substrates. STM observation showed no clear change of the Ag surface morphology resulting from H exposure. All these results indicate that the atomic H adsorbs at neither the Ag surfaces nor Ag bulk sites, but at the Ag/Si interface by diffusing through the Ag film.
Keywords
Thermal desorption spectroscopy , silver , Silicon , hydrogen adsorption , epitaxy , Growth
Journal title
Surface Science
Serial Year
2010
Journal title
Surface Science
Record number
1685657
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