• Title of article

    H adsorption at Ag/Si interfaces in epitaxially grown Ag(1 1 1) films on Si(1 1 1)7 × 7 substrates

  • Author/Authors

    Aoki، نويسنده , , Yuki and Shi، نويسنده , , Lin and Sugimoto، نويسنده , , Tadashi and Hirayama، نويسنده , , Hiroyuki، نويسنده ,

  • Issue Information
    هفته نامه با شماره پیاپی سال 2010
  • Pages
    4
  • From page
    420
  • To page
    423
  • Abstract
    The interaction of atomic H with Ag(1 1 1)/Si(1 1 1)7 × 7 surfaces was studied by thermal desorption (TD) spectroscopy and scanning tunneling microscopy (STM) at room temperature. TD spectroscopy revealed an intense peak from mono H–Si bonds, even though the Si surface was covered by the Ag atoms. This peak was not observed from Ag-coated SiO2/Si substrates. STM observation showed no clear change of the Ag surface morphology resulting from H exposure. All these results indicate that the atomic H adsorbs at neither the Ag surfaces nor Ag bulk sites, but at the Ag/Si interface by diffusing through the Ag film.
  • Keywords
    Thermal desorption spectroscopy , silver , Silicon , hydrogen adsorption , epitaxy , Growth
  • Journal title
    Surface Science
  • Serial Year
    2010
  • Journal title
    Surface Science
  • Record number

    1685657