• Title of article

    Structural and electronic characterization of the MgO/Mo(0 0 1) interface using STM

  • Author/Authors

    Benia، نويسنده , , H.M. and Myrach، نويسنده , , P. and Nilius، نويسنده , , Luke N. and Freund، نويسنده , , H.-J.، نويسنده ,

  • Issue Information
    هفته نامه با شماره پیاپی سال 2010
  • Pages
    7
  • From page
    435
  • To page
    441
  • Abstract
    The nucleation and growth of ultrathin MgO films on Mo(0 0 1) have been investigated with scanning tunneling microscopy and spectroscopy. In the initial growth stage, the MgO forms rather uniform islands with rectangular shapes and defined orientation. This behavior reflects a preferential binding of the oxide O ions to the top positions in the Mo support, which can be realized only in confined areas due to the MgO/Mo lattice mismatch. At monolayer coverage, a characteristic square pattern becomes visible in the STM, indicating the formation of an MgO/Mo coincidence lattice. In the coincidence cell, the interface registry alternates between O and Mg ions being in Mo top positions. The resulting imaging contrast in the STM is dominated by a work-function modulation and not by a topographic effect, as demonstrated with STM-conductance and light-emission spectroscopy. The modulated work function in the coincidence cell is assigned to a small buckling of the oxide film with either O or Mg ions being closer to the Mo surface.
  • Keywords
    Oxide thin films , Nucleation and growth , Coincidence lattice , MGO , MO , Scanning tunneling microscopy and spectroscopy
  • Journal title
    Surface Science
  • Serial Year
    2010
  • Journal title
    Surface Science
  • Record number

    1685660