Author/Authors :
Weier، نويسنده , , D. and Lühr، نويسنده , , T. and Beimborn، نويسنده , , A. and Schِnbohm، نويسنده , , F. and Dِring، نويسنده , , S. and Berges، نويسنده , , U. and Westphal، نويسنده , , C.، نويسنده ,
Abstract :
We investigated the chemical and geometrical characteristics of the system cyclopentene on Si(100) in a combined photoelectron spectroscopy (PES) and photoelectron diffraction (XPD) investigation. In this study synchrotron radiation was applied to achieve a high resolution with high surface sensitivity. Our PES and XPD results show that the cyclopentene reacts with the silicon dimers of the (2 × 1)-reconstructed surface, changing the planar molecule to a diverse tilted molecule after the adsorption.
