Depth-profiling the composition of bimetallic nanoparticles using medium energy ion scattering

The near monolayer depth resolution of medium energy ion scattering is utilized to develop a probe of the depth dependent composition of bimetallic nanoparticles supported on planar oxide supports. The approach fits spectra of scattered ion intensity versus ion energy at well-defined scattering angles taking into account the asymmetric line shape in such spectra and also the depth dependent loss processes encountered by incident ions as they pass through the bimetallic particles.