Title of article
Ultrathin Y2O3(111) films on Pt(111) substrates
Author/Authors
Tao، نويسنده , , Junguang and Batzill، نويسنده , , Matthias، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2011
Pages
8
From page
1826
To page
1833
Abstract
The growth of ultrathin films of Y2O3(111) on Pt(111) has been studied using scanning tunneling microscopy (STM), X-ray photoemission spectroscopy (XPS), and low energy electron diffraction (LEED). The films were grown by physical vapor deposition of yttrium in a 10− 6 Torr oxygen atmosphere. Continuous Y2O3(111) films were obtained by post-growth annealing at 700 °C. LEED and STM indicate an ordered film with a bulk-truncated Y2O3(111)–1 × 1 structure exposed. Furthermore, despite the lattices of the substrate and the oxide film being incommensurate, the two lattices exhibit a strict in-plane orientation relationship with the [11̅0] directions of the two cubic lattices aligning parallel to each other. XPS measurements suggest hydroxyls to be easily formed at the Y2O3 surface at room temperature even under ultra high vacuum conditions. The hydrogen desorbs from the yttria surface above ~ 200 °C.
Keywords
Scanning tunneling microscopy , growth , Low index single crystal surfaces
Journal title
Surface Science
Serial Year
2011
Journal title
Surface Science
Record number
1686191
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