Title of article :
Structural reorientation of PLD grown La2NiO4 thin films
Author/Authors :
Telesca، نويسنده , , D. and Wells، نويسنده , , B.O. and Sinkovic، نويسنده , , B.، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2012
Abstract :
Single crystal La2NiO4 films were grown on STO (001) substrates by use of pulsed laser deposition (PLD). It was found that these films grow with the c-axis in the out of plane direction up to a certain critical thickness. Films thicker than that resulted in a structural reorientation from c-axis to a-axis out of plane orientation. The evolution of the c and a axis were measured by using a four circle X-ray diffractometer.
Keywords :
La2NiO4 , Thin films , Structural reorientation , X-ray diffraction , pulsed laser deposition
Journal title :
Surface Science
Journal title :
Surface Science