Title of article :
Carbon-associated Si(001)-c(4×4) reconstruction dosed with hydrogen
Author/Authors :
Stoffel، نويسنده , , M. and Simon، نويسنده , , L. and Aubel، نويسنده , , D. and Bischoff، نويسنده , , J.L. and Kubler، نويسنده , , L.، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2000
Pages :
6
From page :
201
To page :
206
Abstract :
It has recently been recognized that initial carbon (C) accommodation on Si(001)-(2×1) surfaces (less than 1 monolayer, at 600°C and using various C precursors) causes a c(4×4) surface reconstruction. In this paper we intend to determine the C lattice sites associated to this reconstruction. C 1s XPS signatures indicate a main contribution of C atoms dominantly located in substitutional subsurface sites and a weaker contribution, of 1.6 eV higher binding energy, attributed to C surface sites. C 1s X-ray photoelectron diffraction polar observations along 〈010〉 azimuths ascertain C location within the first five Si layers and the C atoms at the origin of the observed angular modulations are necessarily located from the third to fifth subsurface layers. By c(4×4) surface exposure to atomic hydrogen at room temperature, a 1×1 LEED diagram is restored. As for the Si(001)-(2×1) reconstruction, it demonstrates a break of hydrogen-saturated surface dimers. The latter may be restored by annealing but with a kinetics different from that of a simple Si dihydride desorption. These results essentially support c(4×4) reconstruction models with surface dimers including C atoms and a subsurface C-rich SinC alloy.
Keywords :
Silicon , X-ray photoelectron spectroscopy , Low energy electron diffraction (LEED) , hydrogen atom , silicon carbide , Surface relaxation and reconstruction , Photoelectron diffraction , carbon
Journal title :
Surface Science
Serial Year :
2000
Journal title :
Surface Science
Record number :
1687910
Link To Document :
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