Author/Authors :
Schiavuta، نويسنده , , P. and Cepek، نويسنده , , C. and Sancrotti، نويسنده , , M. and Pedio، نويسنده , , M. and Berti، نويسنده , , M. and De Salvador، نويسنده , , D. and Drigo، نويسنده , , A.V.، نويسنده ,
Abstract :
We report on the electronic, compositional and morphological properties of ultra-thin and thick SiC films produced via disruption of C60 cages onto the Si(111) 7×7 surface. The influence of the reaction temperature and the growth mode of the films have been investigated by means of photoemission spectroscopy, low energy electron diffraction, atomic force microscopy, and Rutherford backscattering.
Keywords :
Fullerenes , growth , silicon carbide , Ceramic thin films
