Title of article :
Oriented growth of DMe-PTCDI on Ag(110); an LEED, XPS, SFM and STM characterisation
Author/Authors :
Seidel، نويسنده , , C. and Schنfer، نويسنده , , A.H. Paulitsch-Fuchs، نويسنده , , H.، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2000
Abstract :
Epitaxial monolayer and multilayer structures of DMe-PTCDI (of 2,9-dimethyl-antra [2,1,9-def:6,5,10-d′e′f′]diisoquinoline-1,3,8,10-tetrone) were prepared on Ag(110) by molecular beam epitaxy. This work presents structural and electron photoemission data for further investigations where highly laterally oriented multilayer films are important. Preparation conditions for five highly ordered monolayer and two multilayer structures are presented. LEED images taken during preparation show the transitions between the exposure and temperature-induced structures. In addition, the structures were examined by XPS, SFM and STM.
Keywords :
Low energy electron diffraction (LEED) , surface structure , morphology , Roughness , and topography , X-ray photoelectron spectroscopy , silver
Journal title :
Surface Science
Journal title :
Surface Science