• Title of article

    Surface EXAFS study of the p4g(2×2) reconstruction of C on Ni(100) and C on Ni films

  • Author/Authors

    Wende، نويسنده , , H. and Chauvistré، نويسنده , , R. and Haack، نويسنده , , N. and Ceballos، نويسنده , , G. and Wilhelm، نويسنده , , F. and Baberschke، نويسنده , , K. and Srivastava، نويسنده , , P. and Arvanitis، نويسنده , , D.، نويسنده ,

  • Issue Information
    هفته نامه با شماره پیاپی سال 2000
  • Pages
    11
  • From page
    187
  • To page
    197
  • Abstract
    We report temperature- and angular-dependent surface extended X-ray absorption fine structure spectroscopy (SEXAFS) measurements of the p4g(2×2)C/Ni(100) system. Both a Ni(100) single crystal and a 4 monolayer Ni film evaporated on a Cu(100) single crystal were used as substrates. The k-space used for the data analysis needs to be truncated at low k values. This is due to a strong increase of the atomic background close to the edge, which prevents a clear separation of near-edge features from the SEXAFS oscillations. For both substrates the local structure can be described by the ’clockwise’ reconstruction of the surface. This leads to a strong anisotropy of the vibrational amplitudes: the vibrational amplitude for the out-of-plane CNi bond at room temperature is determined to be twice as large as that for the in-plane motion.
  • Keywords
    Extended X-ray absorption fine structure (EXAFS) , Surface relaxation and reconstruction , nickel , carbon
  • Journal title
    Surface Science
  • Serial Year
    2000
  • Journal title
    Surface Science
  • Record number

    1688849