• Title of article

    Surface structure and electron density dependence of scattered Ne+ ion fractions from the Si(1 0 0)-(2×1) surface

  • Author/Authors

    I. Vaquila، نويسنده , , I. and Lui، نويسنده , , K.M. and Rabalais، نويسنده , , J.W. and Wolfgang، نويسنده , , J. and Nordlander، نويسنده , , P.، نويسنده ,

  • Issue Information
    هفته نامه با شماره پیاپی سال 2001
  • Pages
    10
  • From page
    255
  • To page
    264
  • Abstract
    The magnitudes and azimuthal anisotropies of 4 keV Ne+ scattered ion fractions from the Si(1 0 0)-(2×1) two-domain surface have been measured by means of time-of-flight scattering and recoiling spectrometry. The absolute values of these ion fractions as well as their dependence on surface structure and electron density have been determined. By investigating the trajectories of the scattered Ne+, a clear correlation is demonstrated between these experimentally observed surviving ion fractions of Ne+ and the fraction of ions that scatters from the topmost layer of the surface. This is interpreted in terms of a model in which the neutralization probability of Ne+ is proportional to the local substrate electronic charge density.
  • Keywords
    morphology , Roughness , and topography , Silicon , Semi-empirical models and model calculations , surface structure , Ion–solid interactions
  • Journal title
    Surface Science
  • Serial Year
    2001
  • Journal title
    Surface Science
  • Record number

    1688945