Title of article
Surface structure and electron density dependence of scattered Ne+ ion fractions from the Si(1 0 0)-(2×1) surface
Author/Authors
I. Vaquila، نويسنده , , I. and Lui، نويسنده , , K.M. and Rabalais، نويسنده , , J.W. and Wolfgang، نويسنده , , J. and Nordlander، نويسنده , , P.، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2001
Pages
10
From page
255
To page
264
Abstract
The magnitudes and azimuthal anisotropies of 4 keV Ne+ scattered ion fractions from the Si(1 0 0)-(2×1) two-domain surface have been measured by means of time-of-flight scattering and recoiling spectrometry. The absolute values of these ion fractions as well as their dependence on surface structure and electron density have been determined. By investigating the trajectories of the scattered Ne+, a clear correlation is demonstrated between these experimentally observed surviving ion fractions of Ne+ and the fraction of ions that scatters from the topmost layer of the surface. This is interpreted in terms of a model in which the neutralization probability of Ne+ is proportional to the local substrate electronic charge density.
Keywords
morphology , Roughness , and topography , Silicon , Semi-empirical models and model calculations , surface structure , Ion–solid interactions
Journal title
Surface Science
Serial Year
2001
Journal title
Surface Science
Record number
1688945
Link To Document