Title of article :
Element-selective mapping of magnetic moments in ultrathin magnetic films using a photoemission microscope
Author/Authors :
Kuch، نويسنده , , W. and Gilles، نويسنده , , J. and Offi، نويسنده , , F. and Kang، نويسنده , , S.S. and Imada، نويسنده , , S. and Suga، نويسنده , , S. and Kirschner، نويسنده , , J.، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2001
Pages :
10
From page :
153
To page :
162
Abstract :
We combine X-ray magnetic circular dichroism (XMCD) and photoelectron emission microscopy to obtain locally resolved magnetic information on a microscopic scale. Scanning the photon energy across elemental absorption edges and recording microscopic images of the local secondary electron intensity for both photon helicities at each photon energy step allows to analyze local XMCD spectra at any position of the imaged area of the sample. With the help of magnetic sum-rules local quantitative information about magnetic moments can be extracted from such microspectroscopic measurements. The full power of XMCD as a spectroscopic tool is so maintained, while microscopic spatial resolution is added.
Keywords :
Photoemission (total yield) , Photoelectron emission , Iron , Magnetic films , nickel , X-ray absorption spectroscopy
Journal title :
Surface Science
Serial Year :
2001
Journal title :
Surface Science
Record number :
1689854
Link To Document :
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