Title of article :
Behaviour of sodium deposited onto thin silica layers
Author/Authors :
Lagarde، نويسنده , , P and Flank، نويسنده , , Roberto Mazzara، نويسنده , , C and Jupille، نويسنده , , J، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2001
Abstract :
Sodium has been deposited on silica surfaces in vacuum conditions. It has been shown by X-ray absorption spectroscopy (XAS) that its behaviour depends dramatically on the temperature of the substrate. When evaporated on clean silica surface, sodium diffuses into the bulk of the material with a well defined chemical environment which involves oxygen, sodium and silicon at distances of 2.3, 2.9 and 3.8 إ, respectively. On silica at temperature below 220 K, a metallic sodium film is formed but, upon warming the sample up to room temperature, sodium diffuses readily into the silica substrate. Finally, XAS at the silicon K-edge demonstrates that a strong modification of the mid-range order of the silicon in the silica occurs upon the dissolution of the sodium.
Keywords :
X-ray absorption spectroscopy , Silicon oxides , alkali metals , Amorphous thin films
Journal title :
Surface Science
Journal title :
Surface Science