Title of article
Surface characterization of metallic molecular organic thin films: tetrathiafulvalene tetracyanoquinodimethane
Author/Authors
Rojas، نويسنده , , C. G. Caro، نويسنده , , J. and Grioni، نويسنده , , M. and Fraxedas، نويسنده , , J.، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2001
Pages
6
From page
546
To page
551
Abstract
The electronic structure of ex situ grown highly oriented thin films of the quasi-1D organic metal tetrathiafulvalene tetracyanoquinodimethane (TTF–TCNQ) has been characterized by means of temperature-dependent high-resolution angle-resolved photoemission spectroscopy and X-ray photoelectron spectroscopy. Band dispersion near the Fermi level (EF) is observed at low temperatures (∼100 K) for as-received samples. At room temperature both charged and neutral TCNQ species (TCNQ− and TCNQ0, respectively) coexist at the surface. The presence of TCNQ0, partly due to surface thermal vibrations, is reduced at lower temperatures because of the smaller surface oscillation amplitudes.
Keywords
Angle resolved photoemission , Polycrystalline thin films , Metallic films , X-ray photoelectron spectroscopy
Journal title
Surface Science
Serial Year
2001
Journal title
Surface Science
Record number
1690069
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