Title of article :
Second layer rumpling in Ni(1 1 0)c(2×2)–S
Author/Authors :
Woodhead، نويسنده , , A.P and Bailey، نويسنده , , P and Noakes، نويسنده , , T.C.Q and Norman، نويسنده , , D and Thornton، نويسنده , , G، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2002
Abstract :
Medium energy ion scattering (MEIS) using 100 keV H+ ions has been used to study the structure of Ni(1 1 0)c(2×2)–S. Blocking curves in two of the three principal azimuths have been measured in order to determine the atomic positions in both the surface and sub-surface layers. The MEIS data indicate that S lies 0.90±0.06 Å above the plane of the first layer Ni. The average distance of 1.39±0.04 Å found for the first to second nickel layer spacing corresponds to an expansion of 12% when compared to the bulk layer spacing and we find a rumpling of 0.18±0.07 Å in the second layer. The polarity of rumpling is such that Ni atoms capped by S lie closer to the surface.
Keywords :
nickel , Sulphur , Medium energy ion scattering (MEIS) , Surface relaxation and reconstruction , Nickel sulphide
Journal title :
Surface Science
Journal title :
Surface Science