The effect of sample tilt on an emission microscope

In an emission electron microscope with electrostatic optics, the sample is part of the optics. If the sample is tilted with respect to the optic axis, the image will shift by an amount depending on the energy of the emitted electrons. This shift could cause a loss of resolution in the direction of the tilt. In this paper, a simple model is presented for the image shift and the predictions of this model are tested against simulations.