Title of article
Visible and UV pulsed laser processing of the Ti/Si(0 0 1) interface studied by XPS microscopy with synchrotron radiation
Author/Authors
Larciprete، نويسنده , , R and Danailov، نويسنده , , M and Barinov، نويسنده , , A and Casalis، نويسنده , , L and Gregoratti، نويسنده , , L and Goldoni، نويسنده , , A and Kiskinova، نويسنده , , M، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2001
Pages
6
From page
141
To page
146
Abstract
The composition and spatial distribution of different Ti–Si phases formed by irradiation of a 5 ML Ti film deposited on Si(1 0 0) with visible and UV short laser pulses was studied employing scanning XPS microscopy with lateral resolution of 0.12 μm. The lineshape of the Ti 2p and Si 2p spectra and the Ti 2p and Si 2p maps of the laser processed area have revealed that TiSi is produced in the external region of the laser spots, where the surface temperature does not exceed 500°C, whereas in the central area TiSi2 forms. The synthesis of more diluted alloys is consistent with the thermal gradient existing on the Ti/Si(0 0 1) surface during laser irradiation.
Keywords
Silicides , laser methods
Journal title
Surface Science
Serial Year
2001
Journal title
Surface Science
Record number
1690928
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