Investigation of latent tracks in polyethyleneterephthalate and their etching

The areas of radiation damage––latent tracks (LT) at the surface of polymer film (PET), irradiated with swift heavy ions of different types (Xe and Bi) were investigated by atomic-force microscopy (AFM) and X-ray photoelectron spectroscopy (XPS). The surface of these samples was also analyzed after different types of treatment: swelling in the water and alkali chemical etching. The alkali etching process was examined at different stages and it was found, that carboxyl groups concentration at the sample surface increased, while alcohol groups concentration remains nearly constant. At the same time, the products with carboxyl groups in etching solution does not change until through pores formation. The combination of AFM, XPS methods with chemical and chromatography techniques gave information about complicated structure of LT and mechanism of etching.