Title of article
Molecular surface structure of poly(3-hexylthiophene) studied by low energy ion scattering
Author/Authors
M.W.G Ponjée، نويسنده , , M.W.G and Reijme، نويسنده , , M.A and Langeveld-Voss، نويسنده , , B.M.W and Denier van der Gon، نويسنده , , A.W. and Brongersma، نويسنده , , H.H، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2002
Pages
7
From page
194
To page
200
Abstract
Low energy ion scattering and X-ray photoelectron spectroscopy were used to study the surface of thin spin-coated poly(3-hexylthiophene) (P3HT) films on silica. We found that the composition of the outermost surface differs from that of the bulk due to the surface molecular structure: the sulphur atoms are screened from being at the outermost surface, presumably by the hexyl side-chains. The influence of this intramolecular segregation phenomenon on the composition is limited to the outermost surface. Comparison of the sputter-profile of P3HT with that taken on a polycrystalline α-quaterthiophene film shows that after sputtering the sulphur to carbon atomic ratio of bulk P3HT is observed.
Keywords
Low energy ion scattering (LEIS) , sputtering , surface segregation , surface structure , morphology , and topography , Amorphous surfaces , Aromatics , Roughness
Journal title
Surface Science
Serial Year
2002
Journal title
Surface Science
Record number
1694622
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