Title of article :
Photoelectron spectroscopy measurements of the valence band structures of polymerized thin films of C60 and La0.1C60
Author/Authors :
Ha، نويسنده , , B and Rhee، نويسنده , , J.H. and Li، نويسنده , , Y and Singh، نويسنده , , D and Sharma، نويسنده , , S.C، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2002
Pages :
7
From page :
186
To page :
192
Abstract :
The electronic valence band structures of polymerized thin films of C60 and La0.1C60 have been studied by using ultra-violet photoelectron spectroscopy. Additionally, the films have been characterized by using Raman spectroscopy, X-ray photoelectron spectroscopy, and X-ray diffraction. The valence band of the C60 film shows major peaks at binding energies of 2.6, 7.2, 10.3, and 12.6 eV. In the case of the doped film, we observe (i) an additional peak with a binding energy of 13.7 eV, (ii) evidence for redistribution of the density of electronic states due to hybridization between the 5d orbitals of La and the C60 cage, and (iii) significantly higher density of the electronic states near the Fermi energy. The valence band spectra of the doped film are in good agreement with recent results of the density functional theory that support strong hybridization between the d-valence orbitals of La and the C60 cage.
Keywords :
Photoelectron spectroscopy , Raman scattering spectroscopy , X-Ray scattering , and reflection , excitation spectra calculations , Fullerenes , electron density , Diffraction
Journal title :
Surface Science
Serial Year :
2002
Journal title :
Surface Science
Record number :
1694991
Link To Document :
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