Title of article :
Structural and morphological analyses of tungsten oxide nanophasic thin films obtained by MOCVD
Author/Authors :
Barreca، نويسنده , , D. and Bozza، نويسنده , , S. and Carta، نويسنده , , G. and Rossetto، نويسنده , , G. and Tondello، نويسنده , , E. and Zanella، نويسنده , , P.، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2003
Pages :
5
From page :
439
To page :
443
Abstract :
Nanophasic tungsten oxide thin films were deposited at 500 °C on quartz and glass substrates starting from W(CO)6 using the metal organic chemical vapour deposition technique. The films were analysed by X-ray diffraction, X-ray photoelectron spectroscopy and scanning electron microscopy. By using an O2 + H2O atmosphere, the fully oxidized tungsten yellow compound was obtained (tetragonal WO3) with a morphology characterized by pyramidal-shaped grains. The average crystallite size resulted of 75 nm. Conversely, under a N2 + H2 atmosphere, a polycrystalline blue deposit was obtained, corresponding mainly to a mixture of oxides in the composition range between WO2.7 and WO3. The crystallites have an average size of 50 nm and the morphology revealed a packed structure, with grains in a singular wool skein shape.
Keywords :
tungsten oxide , chemical vapor deposition , X-ray photoelectron spectroscopy , surface structure , morphology , Scanning electron microscopy (SEM) , Roughness , and topography
Journal title :
Surface Science
Serial Year :
2003
Journal title :
Surface Science
Record number :
1695804
Link To Document :
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