Title of article :
High-resolution Si 2p core-level and low-energy electron diffraction studies of the Ca/Si(1 1 1)-(3 × 2) surface
Author/Authors :
Sakamoto، نويسنده , , Kazuyuki and Takeyama، نويسنده , , Wakaba and Zhang، نويسنده , , H.M. and Uhrberg، نويسنده , , R.I.G.، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2003
Abstract :
We have investigated the surface structure of the Ca/Si(1 1 1)-(3 × 2) surface using low-energy electron diffraction (LEED) and high-resolution core-level photoelectron spectroscopy. Weak ×2 streaks were observed in LEED at 300 K. After cooling the sample to 100 K, ×2 spots, which originate from both (3 × 2) and c(6 × 2) periodicities, appeared. By considering the energy shift and intensity of each surface component observed in the Si 2p core-level spectra, we conclude that the structure of the (3 × 2) surface is basically the same as that of the honeycomb-chain-channel model with a Ca coverage of 1/6 ML. Further, we propose that the weak ×2 streaks at 300 K result from thermally induced disorder.
Keywords :
Photoelectron spectroscopy , and topography , Semiconducting surfaces , Low energy electron diffraction (LEED) , Silicon , surface structure , morphology , Roughness
Journal title :
Surface Science
Journal title :
Surface Science