• Title of article

    Defect-induced dimer pinning on the Si(0 0 1) surface

  • Author/Authors

    Wilson، نويسنده , , H.F. and Marks، نويسنده , , N.A. and McKenzie، نويسنده , , D.R.، نويسنده ,

  • Issue Information
    هفته نامه با شماره پیاپی سال 2005
  • Pages
    8
  • From page
    185
  • To page
    192
  • Abstract
    Room-temperature STM images frequently show regions of antisymmetric dimer ordering surrounding certain types of defect on the Si(0 0 1) surface. While it has been generally believed that any defect asymmetric with respect to the dimer row would induce this dimer pinning effect, recent experimental results have shown that this is not the case. We present a model, based on a nearest-neighbour Ising treatment of the surface, which allows the extent of pinning caused by a dimer to be predicted from ab initio calculations. We use this model to predict the pinning extent for three phosphorus-containing structures important in a proposed silicon-based quantum computer fabrication scheme, and identify one of these asymmetric features as causing no appreciable pinning. In addition, we use ab initio calculations to identify the effects governing the interaction between neighbouring dimers.
  • Keywords
    Surface relaxation and reconstruction , Ab initio quantum chemical methods and calculations , Ising models , Scanning tunneling microscopy , Silicon , Monte-Carlo simulations
  • Journal title
    Surface Science
  • Serial Year
    2005
  • Journal title
    Surface Science
  • Record number

    1697329