Title of article :
A calibrated finite element model of adhesive peeling
Author/Authors :
Cui، نويسنده , , J. and Wang، نويسنده , , R. and Sinclair، نويسنده , , A.N. and Spelt، نويسنده , , J.K.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2003
Pages :
8
From page :
199
To page :
206
Abstract :
A finite element model of the flexible-rigid peel test was compared with experimental steady-state peel forces for nine configurations (three adherend thicknesses and three angles) in order to investigate the von Mises critical strain as a failure criterion. It was found that the critical von Mises strain was approximately constant for a given adherend thickness at the three peel angles, but that it increased significantly as the adherend thickness increased. Modification of the functional dependence of adhesive yield stress on hydrostatic stress did not correct for this thickness dependence. The steady-state peel geometry and loads were determined by executing the model incrementally through small load steps beginning with the initial undeformed shape of the adherend. This simulation of the transient stage of the peel test illustrated the large differences between the peel force and geometry at the onset of adhesive failure and at steady state.
Keywords :
B. Aluminium and alloys , C. Stress analysis , D. Fracture , A. Epoxy/epoxides
Journal title :
International Journal of Adhesion and Adhesives
Serial Year :
2003
Journal title :
International Journal of Adhesion and Adhesives
Record number :
1698016
Link To Document :
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