Critical analysis of the substrate deformation correction in the thick-adherend tensile-shear test

The substrate deformation correction in the tensile-shear test of adhesive technology has been investigated. A technique based on the finite element method simulating the deformation behaviour of a reference specimen is compared with the simple procedure resting on Hookeʹs law according to ISO 11003-2. The simulations reveal that the numerical correction technique based on the finite element deformation modelling of the reference specimen leads to more realistic results. Explanations of the deviation from the correction founded on Hookeʹs law are given.