Title of article :
Cross-sectional scanning tunneling microscopy and spectroscopy of strain in buried heterostructure lasers
Author/Authors :
Cobley، نويسنده , , R.J. and Teng، نويسنده , , K.S. and Maffeïs، نويسنده , , T.G.G. and Wilks، نويسنده , , S.P.، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2006
Abstract :
Cross-sectional scanning tunneling microscopy and spectroscopy have been used to probe the unreconstructed (1 1 0) surface of a commercially available buried heterostructure laser in ultra high vacuum. Complex re-growth above the non-linear blocking layers is shown to induce tensile strain in the device. Spectroscopic measurements show an increase in both the density of filled valence band states and empty conduction band states as a result of the strain, with a particularly large increase at −3.1 V. Current imaging tunneling spectroscopy measurements show an increase in the tunneling current in to and out of the strained regions at both gap voltage polarities, consistent with the spectroscopy. Moving towards tensile strain, InP is known to maintain much the same bandgap, with the split-off level and lower lying states being drawn up towards the valence band edge, consistent with the data.
Keywords :
Scanning tunneling microscopy , Scanning tunneling spectroscopies , Indium phosphide , Heterojunctions , Semiconducting surfaces
Journal title :
Surface Science
Journal title :
Surface Science