Title of article :
Photoemission, NEXAFS and STM studies of pentacene thin films on Au(1 0 0)
Author/Authors :
McDonald، نويسنده , , O. and Cafolla، نويسنده , , A.A. and Carty، نويسنده , , D. and Sheerin، نويسنده , , G. and Hughes، نويسنده , , G.، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2006
Pages :
9
From page :
3217
To page :
3225
Abstract :
We have investigated the initial stages of the growth of pentacene thin films on the Au(1 0 0) substrate using synchrotron radiation photoelectron spectroscopy (PES), near edge X-ray absorption fine structure (NEXAFS) and scanning tunnelling microscopy (STM). Results indicate a well-ordered structure with the pentacene molecules adopting a predominantly flat orientation with respect to the substrate for coverages of less than three monolayers. NEXAFS and photoemission data indicates the presence of a second molecular orientation for thicker films, with the introduction of a slight tilting away from planar bonding geometry at higher pentacene coverages. STM images of coverages less than three monolayers indicate a well-ordered pentacene structure allowing for the calculation of pentacene unit cell parameters. The pentacene molecular rows adopt a side-by-side bonding arrangement on the surface. For pentacene deposited at room temperature, step edges were observed to act as nucleation centres for film growth. Annealing of the substrate to 373 K was found to remove excess molecules and improve film quality, but did not otherwise change the bonding geometry of the pentacene with respect to the surface.
Keywords :
Soft X-ray photoelectron spectroscopy , Scanning tunneling microscopy , workfunction , Metal–organic interface , Interface dipole , pentacene , Near edge extended X-ray absorption fine structure (NEXAFS)
Journal title :
Surface Science
Serial Year :
2006
Journal title :
Surface Science
Record number :
1698796
Link To Document :
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