Title of article :
Structure of GaAs(0 0 1)-c(4 × 4): Comparison of X-ray diffraction and first-principles calculation
Author/Authors :
Takahasi، نويسنده , , M. and Kratzer، نويسنده , , P. and Penev، نويسنده , , E. and Mizuki، نويسنده , , J.، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2006
Abstract :
The surface structure of GaAs(0 0 1)-c(4 × 4) was investigated by synchrotron surface X-ray diffraction which is sensitive to both in-plane and out-of-plane structures. The atomic coordinates and Debye–Waller factors for up to the sixth layer from the surface are given. The resultant atomic coordinates were compared with those given by a first-principles calculation. Among a variety of heterodimer models that were examined by theoretical calculation, our data fit best a three-heterodimer model where three Ga–As heterodimers are present in one unit cell. The preference for the formation of heterodimers is discussed in relationship to the transition process from the 2 × 4 to the c(4 × 4) structures.
Keywords :
and reflection , X-Ray scattering , Growth , Semiconductor , Gallium arsenide , Diffraction
Journal title :
Surface Science
Journal title :
Surface Science