Title of article :
Size dependence of lattice parameter for SixGe1−x nanoparticles
Author/Authors :
Isaac R. Shreiber، نويسنده , , D. and Jesser، نويسنده , , W.A.، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2006
Pages :
7
From page :
4584
To page :
4590
Abstract :
The phenomenon of the influence of the size of a material on its properties has been predicted theoretically and was confirmed for many materials experimentally by many researchers. It is a purpose of this paper to increase understanding of the influence of size on properties for silicon, germanium and alloy silicon–germanium nanoparticles. The relationships between lattice parameter and inverse particle radius had been investigated. The data obtained from the experiments show an unpredicted result that the lattice parameter of the SixGe1−x nanoparticle expands by up to 1.5% when the size of the particle decreases to 7 nm. A calibration technique for a higher precision measurement of the lattice parameter is presented. The particles under investigation were deposited on an amorphous carbon substrate in order to prevent the influence of the misfit between deposit and crystalline substrate on the particle’s behavior.
Keywords :
Transmission electron microscopy (TEM) , Lattice parameter measurements , Nanoparticles , Silicon–germanium , Amorphous substrate
Journal title :
Surface Science
Serial Year :
2006
Journal title :
Surface Science
Record number :
1699730
Link To Document :
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