Title of article
Normal incidence X-ray standing wave analysis of thin gold films
Author/Authors
Brian W. Satterley، نويسنده , , Christopher J. and Lovelock، نويسنده , , Kevin R.J. and Thom، نويسنده , , Ian and Dhanak، نويسنده , , Vinod R. and Buck، نويسنده , , Manfred and Jones، نويسنده , , Robert G.، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2006
Pages
4
From page
4825
To page
4828
Abstract
Normal incidence X-ray standing wave (NIXSW) analysis has been successfully performed on epitaxial gold films on mica substrates using reflection from the (1 1 1) planes parallel to the surface. We show that NIXSW can be used to monitor the decrease in order within the gold film caused by annealing, and the position of sulfur within a monolayer of methyl thiolate (CH3S–) on the surface. The Au–S layer spacing was found to be 2.54 ± 0.05 Å, in close agreement with previous work on a single crystal system.
Keywords
epitaxy , Self assembly , surface structure , Gold , X-ray standing waves , Mica , thiols , Single crystal epitaxy
Journal title
Surface Science
Serial Year
2006
Journal title
Surface Science
Record number
1699821
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