Author/Authors :
Barredo، نويسنده , , D. and Calleja، نويسنده , , Oyeyemi F. and Weeks، نويسنده , , A.E. and Nieto، نويسنده , , P. and Hinarejos، نويسنده , , J.J. and Laurent، نويسنده , , G. and Vazquez de Parga، نويسنده , , A.L. and MacLaren، نويسنده , , D.A. and Farيas، نويسنده , , D. L. Allison and P. G. Mikellides ، نويسنده , , W. and Miranda، نويسنده , , R.، نويسنده ,
Abstract :
AFM, STM and diffraction of He and H2 have been used to assess Si(1 1 1)–H(1 × 1) surfaces for their potential as mirrors for matter-waves. The H-passivated samples are produced by wet-chemical methods and delivered to a different laboratory for diffraction measurements. We show that the surface is flat and homogenous over lateral scales of microns and that absolute He and H2 reflectivities of the order of ∼3% are obtained, even after 20 h storage under Ar and several days’ storage in UHV. These characteristics allow the use of Si(1 1 1)–H(1 × 1) as a highly reflective mirror for atoms and molecules, with application in a future He microscope or focused hydrogen nano-lithography system.
Keywords :
Scanning tunneling microscopy , Atom-solid interactions , Silicon , Atom-solid interactions , scattering , Diffraction , atomic force microscopy
